- 측정기 | Detector & Analyzer > Laser Beam Profiler
Product |
BeamMap2-CM Collimate – XYZΘΦ Scanning Slit System 190 to 1150 nm, Silicon detector 650 to 1800 nm, InGaAs detector 1000 to 2300 or 2500 nm, InGaAs (extended) detector Beam diameters ~100 µm to ~3 mm (1.5 mm with extended InGaAs) 25 µm slit pairs with Si; 0.1 to 2 µm sampling intervals 50 µm slit pairs with InGaAs; 0.1 to 2 µm sampling intervals Real-time ±1 mr real-time Divergence and Pointing measurement accuracy Port-powered USB 2.0; flexible 3 m cable, no power brick 0.1 µm sampling and resolution Linear & log X-Y profiles, centroid Profile zoom & slit width compensation Real-time multiple Z plane scanning slit system Real-time XYZ profiles, Focus position Real-time M², Divergence, Collimation, Alignment |
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Application |
Laser printing & marking Medical lasers Diode laser systems Fiber optic telcom assembly focusing – LensPlate2™ option for re-imaging waveguides and fiber ends Development, production, field service CW; Pulsed lasers, Φ µm ≥ [500/(PRR in kHz)] |
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