- 전자장치 | Electronics > Laser Diode Test System
Product |
Reliability test system for laser diode qualification in pulsed or CW regime -. From CW (Continuous Wave) down to less than 1 ns pulse width -. CW-LIV and Pulsed-LIV testing to avoid thermal effects -. 100% independent behavior of each laser diode -. Ideal for Butterfly or other fiber coupled packages (Mini-Butterfly, TOSA, TO-Can etc.) -. Embedded flash memory in each tray of 8 laser diodes -. Programming supervisory GUI with easy-to-use graphical interface -. Full laser protection with special protective window |
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