- 측정기 | Detector & Analyzer > Laser Beam Profiler
Product |
BladeCam-XHR – 1/2" CMOS Beam Profiler System 355 to 1150 nm, standard CMOS detector 3.1 Mpixel‚ 2048 x 1536 pixels, 6.5 x 4.9 mm active area 3.2 µm pixels HyperCal™ – Dynamic Noise and Baseline Correction software Port-powered USB 2.0; flexible 3 m cable, no power brick 10-bit ADC, 4 MB image buffer & on-board microprocessor Window-free sensors standard for no fringing 25,000:1 electronic auto-shutter, 40 µs to 1000 ms 1,000:1 SNR (30/60 dB Optical/Electrical) Field-replaceable image sensors M² option – beam propagation analysis, divergence, focus |
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Application |
CW** laser profiling Field servicing of lasers and laser-based systems Optical assembly & instrument alignment Beam wander & logging M² measurement with available M2DU stage |
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