Advances in beam deliveryenable high-precision manufacturing
 
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 Today, ultrafast lasers (ultrafast-pulsed lasers with pulse durations in
 the femtosecond and picosecond range) are an important part of many
 industrial processes. The ability of these lasers for high-quality,
 virtually athermal material processing, coupled with advances in laser
 technology, process development, beam handling, and delivery, have opened
 the door for numerous advanced scientific and industrial applications.
 However, to achieve economic break-even points, several criteria must be
 simultaneously fulfilled. First, the technical feasibility of the
 industrial process has to be demonstrated. Because of the unique nature
 of ultrafast laser-matter interaction, this usually requires a
 sophisticated scientific understanding of the process. Second, the productivity
 of the industrial process must guarantee a sufficient return on
 investment for the end user. This has led to an important effort in laser
 development towards high-average-power ultrafast lasers, which in turn
 requires advances in beam handling and delivery to take full advantage of
 the potential processing speed. Nowhere else than in consumer electronics
 applications are these trends more in evidence. Cell phones,
 microprocessors, display panels, and memory chips are extremely
 sophisticated components, comprising a large number of different
 materials, multiple layers of extremely low thicknesses, and very small
 features. They require advanced and high-precision manufacturing
 processes, as well as the capability to be produced economically in large
 quantities. The following examples will outline the need for simultaneous
 development of process understanding, laser technology, and new beam
 delivery technique to meet present and future challenges. FIGURE 1.
 Thin-film transistor electrode cutting, with cut width of 1.9μm.
 (Courtesy: Korean Institute of Metals and Machinery) Manufacturing
 flat-panel displays for cell phones, tablets, or TVs is one of the most
 complex technological endeavors today-on par with the Apollo program
 development in the 1960s or arguably even more difficult. The different
 production steps involve a number of different materials, with micrometer
 lateral resolution and layers a few 10s of nanometers thick. Given the
 difficulty of the entire process, it is no surprise that the industrial
 yield (the percentage of units that pass the stringent quality control)
 is both a closely guarded secret and a major challenge. A key limitation
 is the presence on a panel of a few "dead" pixels, which will
 prevent the commercialization of the screen. For the past several years,
 different repair
 
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 FIGURE 1. Thin-film transistor electrode cutting, with cut widthof 1.9μm. (Courtesy: Korean Institute of Metals and Machinery)
 
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 processes-usuallyinvolving multi-wavelength nanosecond lasers-have been developed. For
 instance, a bright pixel might be destroyed, either by laser
 carbonization or by cutting the electrode of the thin-film transistor
 controlling the pixel (FIGURE 1).
 
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 Today, current techniques are reaching their limits. Because of the
 improvement in the resolution of high-definition screens, the pixel size
 is becoming smaller and thermal effects associated with nanosecond laser
 processing are limiting the quality of the repair. Moreover, new display
 technologies, such as organic LEDs (OLEDs) and active-matrix OLEDs
 (AMOLEDs), make extensive use of organic and polymer materials, which are
 highly sensitive to heating and incompatible with thermal processing.
 Because of their very short pulse duration, ultrafast lasers allow for
 virtually athermal micromachining without any heat generation. Their
 increasing use in the advanced display repair process led to the
 development of a new generation of compact, high-speed, multi-wavelength
 ultrafast lasers. Several industrial processes have been developed to
 take advantage of the high precision of ultrafast laser processing. This
 includes selective layer ablation, where ablation rates as precise as
 30nm per pulse are routinely achieved, and high-precision thin-film
 transistor electrode cutting, which has a cutting width smaller than 2μm.
 These processes require the development of advanced and flexible beam
 shaping techniques, allowing the delivery of uniform, flat-top beams with
 variable shape to the sample and sizes as low as 2 × 2μm. In another
 example, semiconductor circuits are becoming increasingly sophisticated.
 They integrate more functions, with smaller feature sizes. To this end,
 wafers are now comprised of many layers of multiple materials, such as
 low-k materials for faster operation. An important process in
 semiconductor manufacturing is the wafer dicing-or singulation-step,
 where a wafer is cut into individual dies (FIGURE 2).
 Traditionally done with diamond saws, current techniques are now reaching
 their limitation. Due to low-k materials' brittleness, lower thickness,
 and high number of layers, adverse effects such as cracks and
 delamination are increasingly liable to occur.
 
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 FIGURE 2. Semiconductor wafer dicing and scribing. (Courtesy:Amplitude Systemes)
 
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 Although there is astrong development drive using ultraviolet (UV) nanosecond lasers, the
 thermal effects associated with nanosecond laser processing represent a
 strong limitation in the quality of the results. On the other hand,
 ultrafast lasers have demonstrated their capability to process silicon
 and multiple materials with a high quality. Until recently, a main
 limitation was the limited average power available from ultrafast lasers,
 which severely limited the overall throughput. The recent development of
 industry-ready, high-reliability femtosecond lasers in the 50-100W range
 allows reaching throughput compatible with industry requirements.
 
 Ultrafast lasers are an essential part of many advanced micromachining
 processes, and they also play a significant role in quality control and
 metrology. Rudolph Technologies (Flanders, NJ; www.rudolphtech.com) recently
 introduced a new industrial tool for the measurement of opaque thin-film
 thickness in the semiconductor industry. The system is based on acoustic
 wave measurement and uses a very short, laser-generated ultrasound pulse.
 The timing of the reflections of this ultrasound pulse on the various
 layer interfaces is measured using a pump-probe technique with high
 accuracy.
 
 In another example, CAMECA (Gennevilliers, France; www.cameca.com) is able to perform 3D
 imaging and analytical characterization of semiconductor and metal
 samples, with atom-scale resolution. This incredible measurement process
 is based on a technique called atom-probe tomography, which involves
 irradiating a nanometer-radius tip of a sample with an ultrafast laser (FIGURE 3).
 If the power of the laser is carefully controlled, instead of laser
 ablation, a gentle atom-by-atom evaporation takes place. Each atom is
 then sent onto a position-sensitive detector, which determines the
 location on the tip from which it comes. In addition, a time-of-flight
 mass spectrometer measures the atomic weight and, therefore, the tip
 composition. Then, 3D reconstruction is performed layer by layer. This
 method is used in the semiconductor industry to monitor the composition
 and impurities of the semiconductor material, as well as in metallurgy to
 control, at a very fine scale, the quality of metallurgical alloys.
 
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 Manufacturing and qualitycontrol benefit from the increasing availability of high-power,
 
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 FIGURE 3. The atom-probe tomography principle.(Courtesy: CAMECA) 
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 high-reliability lasersystems. More specifically, ultrafast lasers with average power in the
 range of 50 to 200W increase throughput and productivity, and, in a
 virtuous circle, allow the development of new applications. And yet, beam
 handling and delivery of such high-power lasers is not straightforward.
 Processing speeds of up to 100 m/s are required to reach economic
 break-even while maintaining micrometer-scale positioning accuracy. And
 the current generation of galvanometric mirror-based scanners is reaching
 its limit, calling for new approaches.
 
 ESI (Portland, OR; www.esi.com) has
 introduced a hybrid processing system that combines galvanometer mirrors
 and acousto-optic technology. When operating at a high processing speed,
 the inertia of the scanner mirrors means that they will lag somewhat when
 performing, for instance, a sharp turn, so the processed structure will
 not have the desired shape. Acousto-optic modulators, however, exhibit
 extremely high reactivity, but on a very small field. The combination of
 mirror movement and acousto-optic deflection, precisely synchronized,
 overcomes this limitation. Such a technique is especially useful in the
 manufacturing of interconnected digital circuit patterns, which are
 becoming more tightly integrated and require increased wiring density.
 
 Researchers at DISCO (Tokyo, Japan; www.disco.co.jp)
 have combined the two approaches by simultaneously performing
 micromachining and process control with the same laser. The application
 in this case is blind via-hole drilling of a two-layer substrate with an
 ultrafast laser. The upper layer is a transparent material with a
 thickness of 80μm and the lower layer is a 20μm-thick metal film. To
 precisely control the number of laser pulses required to achieve ablation
 of the transparent substrate only, the plasma emission is monitored with
 an optical spectrum analyzer using a technique known as laser-induced
 breakdown spectroscopy (LIBS). Since the plasma emission has a unique
 emission spectrum depending on the atomic species being ablated, it is
 possible to clearly and accurately identify the instant when the
 transparent layer is fully ablated.
 
 In another approach, polygon scanners can provide scanning speeds greater
 than 100 m/s. Instead of using low-inertia galvanometer mirrors to
 deflect the beam in the x and y directions, a single, multifaceted
 polygonal mirror rotates at a high speed. If the pulse laser is precisely
 
 
 synchronized with the polygonal mirror rotation, only a single spot per
 facet may impact the sample to be processed. In this case, the
 micromachining process is closer to a digital process, where the laser
 has to be switched on and off to produce the desired pattern. To be
 successful, though, this approach requires very precise synchronization
 between the laser and the scanner, high manufacturing accuracy of the
 polygonal mirror, as well as a carefully designed process. Prof. Beat
 Neuenschwander (Bern University of Applied Sciences,
 
 Switzerland; www.bfh.ch), in
 collaboration with Amplitude Systèmes and NextScan (Evergem, Belgium; www.nextscantechnology.com),
 has demonstrated high-speed surface texturing with a 500kHz ultrafast
 laser and micrometer-scale repositioning accuracy. Still, more innovative
 beam delivery approaches are on the way. Industrial ultrafast lasers,
 until recently, were not able to benefit from fiber-optic delivery
 systems, which have transformed laser manufacturing. The confinement of
 the beam in a small fiber core, combined with the very high peak
 intensity associated with ultrafast pulses, gave rise to severe nonlinear
 effects and ultimately fiber degradation. To mitigate this limitation,
 microstructured fibers with hollow cores have been developed, but their
 core diameter is limited to a few microns-too small for practical use.
 The development of hollow-core, large-mode-area Kagome microstructured
 fibers paves the way for fiber delivery of high-energy, high-power
 femtosecond laser beams. The special, hypocycloidal shape of the hollow
 fiber core confines the laser mode, prevents it from interacting with the
 fiber microstructure, and provides a combination of low nonlinearity,
 large mode area, and flexible dispersion control. In collaboration with
 the company Glo Photonics (Limoges, France; www.glophotonics.fr), Amplitude
 Systèmes has demonstrated the delivery of millijoule-class pulses over a
 distance of several meters, while maintaining a sub-500fs pulse duration.
 In another set of experiments, performed in a collaboration with the
 company Photonics Tools (Berlin, Germany; www.photonic-tools.de), average
 power of 100W has been transmitted and pulse compression to sub-100fs
 pulses has also been demonstrated. Other teams and laser manufacturers
 are quickly refining and developing flexible delivery systems using
 Kagome fibers (FIGURE 4), and we can expect a
 profound transformation of ultrafast laser processing systems in the
 years to come.
 
 
 
 Enabled by advances in the physics of short-pulse laser-matter
 interaction, as well as technological developments in beam handling and
 delivery systems, ultrafast lasers have made
 
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 FIGURE4.A Kagome fiber's core
 shape. (Courtesy: CNRS/Glo Photonics)
 
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 their way into the heartof our daily lives. Deeply embedded into the most advanced industrial
 manufacturing processes, they are changing the way we see, the way we
 communicate, and the way we work, and are a key of future generations of
 consumer electronic devices of increased complexity.
 
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 원문정보 : http://www.industrial-lasers.com/articles/print/volume-30/issue-2/features/ultrafast-
 lasers-for-consumer-electronics.html
 
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